







创新的计量学,应用范围广泛:
- • 长度和直径
- • 表面和轮廓
- • 形状和位置
- • 齿轮和轴

液体和糊剂的精确混合与计量:
- • 齿轮计量泵
- • 纤维生产用泵
- • 计量混合分配机以及混合头

用于以下行业无间隙线性和旋转运动的转冲程轴承:
- • 机械工程
- • 精密工程
- • 光学
- • 电子
- • 以及许多其他行业








作为一家活跃于国际范围的公司,Mahr 不仅在德国拥有专利,在世界范围内也拥有专利。

Optical surface measurement: effective, fast, precise

Thanks to their robust design and insensitivity to environmental influences, the devices are suitable for use in test and inspection laboratories as well as for quality assurance in production. The confocal microscopes deliver precise and repeatable 3D measurements of almost all materials, such as metal, glass, ceramics, semiconductors, polymers or organic materials, in just a few seconds.
The areas of application for the optical systems are just as diverse. They are used for roughness measurements in accordance with DIN EN ISO 21920 / 25178, topography measurements such as volume, wear, isotropy or measurements of micro-geometries and layer thicknesses. The devices determine quantitatively traceable 3D characteristic values and are therefore suitable for many industries such as the following:
- Automotive industry
- Mechanical engineering
- Eectronics and semiconductor industry
- Microsystems technology
- Optics
- Medical technology
- Materials management
Two variants to choose from
The MarSurf CM explorer product line offers you user-independent and fully automatic measurements with a travel range of 100 x 100 mm and therefore uncomplicated operation. Depending on your requirements and measuring tasks, you can choose between the two variants MarSurf CM explorer 100 or MarSurf CM plus explorer 100, both of which have a very high repeat accuracy.
Patented multi-pinhole technology for ultra-fast image acquisition
The confocal microscopes guarantee their performance with ultra-fast image acquisition at high measuring point density thanks to the specially developed and patented multi-pinhole technology. This is a particularly low-noise process that ensures high-quality, unfiltered raw data. The devices also offer you high resolution with maximum robustness, edge acceptance and dynamics. They are also characterized by extremely low stray light and robust signaling with high light yield. As a result, they achieve height resolutions down to the nanometer range.
Would you like to find out more about optical metrology for surface analysis from Mahr?
On our website you will find
- further information on the measuring microscopes from Mahr
- our brochure to download